Coercivity analysis in sputtered Sm-Co thin films

被引：0
|
作者：
Prados, C. [1 ]
Hernando, A. [1 ]
Hadjipanayis, G.C. [2 ]
González, J.M. [3 ]
机构：
[1] Instituto de Magnetismo Aplicado, P.O. Box 155, 28230 Las Rozas, Madrid, Spain
[2] University of Delaware, Department of Physics and Astronomy, Newark, DE 19716, United States
[3] Inst. de Cie. Materielles de Madrid, CSIC, Cantoblanco, 28049 Madrid, Spain
来源：
Journal of Applied Physics | 1999年 / 85卷 / 8 II B期
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页码：6148 / 6150
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