High resolution electron microscopy study of grain boundaries in sintered YBa2Cu3O7-δ

被引：0

作者：

Zandbergen, H.W. ^{[1
]}

Gronsky, R. ^{[1
]}

Thomas, G. ^{[1
]}

机构：

[1] Lawrence Berkeley Lab, United States

来源：

Physica C: Superconductivity and its Applications | 1988年 / 153-55卷 / 01期

关键词：

Ceramic Materials--Microscopic Examination - Oxides;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

High resolution electron microscopy (HREM) has been carried out on grain boundaries in dense (>90%) YBa2Cu3O7-δ, being both in the tetragonal and orthorhombic form. Grain boundaries were found to be predominantly parallel to (001) of one of the adjacent grains. No amorphous interlayer was observed in the grain boundaries. In samples sintered and annealed for several days deterioration due to intercalation of the crystal lattice near grain boundaries was observed. It is discussed that the low critical currents in sintered materials are caused by preferred grain growth in combination with the atomic structure at the grain boundary interface, and by the intercalation near the grain boundary.

引用

页码：1002 / 1003