Determination of the adhesive force of molecular deposition film of silica surface by atomic force microscopy

被引：0
|
作者：
Wang, Deguo [1 ]
Gao, Manglai [1 ]
Zhang, Siwei [1 ]
机构：
[1] Univ of Petroleum, Beijing, China
来源：
Shiyou Daxue Xuebao/Journal of the University of Petroleum China | 1999年 / 23卷 / 04期
关键词：
Adhesives; -; Films;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A perfect force-displacement curve measured by using atomic force microscopy (AFM) was analyzed, and a formula for calculating adhesive force according to the testing force-displacement curve was deduced. The adhesive force between silica sample and scanning probe before and after growing molecular deposition films on the surface of silica was experimentally studied. It is found that the molecular deposition can lower the adhesive force on the surface of silica.
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页码：53 / 55
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