On-line BIST for testing analog circuits

被引：0
|
作者：
Velasco-Medina, J. [1 ]
Rayane, I. [1 ]
Nicolaidis, M. [1 ]
机构：
[1] TIMA/INPG, Grenoble, France
来源：
Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors | 1999年
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：330 / 332
相关论文
共 50 条
  • [31] A Discrete Event System approach to On-line Testing of digital circuits with measurement limitation
    Biswal, P. K.
    Sambho, H. P.
    Biswas, S.
    ENGINEERING SCIENCE AND TECHNOLOGY-AN INTERNATIONAL JOURNAL-JESTECH, 2016, 19 (03): : 1473 - 1487
  • [32] On-line testing of digital circuits for n-detect and bridging fault models
    Biswas, S
    Srikanth, P
    Jha, R
    Mukhopadhyay, S
    Patra, A
    Sarkar, D
    14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2005, : 88 - 93
  • [33] The logarithmic checking method for on-line testing of computing circuits for processing of the approximated data
    Drozd, A
    Al-Azzeh, R
    Drozd, J
    Lobachev, M
    PROCEEDINGS OF THE EUROMICRO SYSTEMS ON DIGITAL SYSTEM DESIGN, 2004, : 416 - 423
  • [34] CELLULAR-AUTOMATA AS A BIST STRUCTURE FOR TESTING CMOS CIRCUITS
    NANDI, S
    VAMSI, B
    CHAKRABORTY, S
    CHAUDHURI, PP
    IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES, 1994, 141 (01): : 41 - 47
  • [35] On-line planarity testing
    DiBattista, G
    Tamassia, R
    SIAM JOURNAL ON COMPUTING, 1996, 25 (05) : 956 - 997
  • [36] On-line testing for VLSI
    Nicolaidis, M
    ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY, 1997, : 1042 - 1042
  • [37] Implicit functional testing for analog circuits
    Pan, CY
    Cheng, KT
    14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1996, : 489 - 494
  • [38] Digital-compatible BIST for analog circuits using transient response sampling
    Variyam, PN
    Chatterjee, A
    IEEE DESIGN & TEST OF COMPUTERS, 2000, 17 (03): : 106 - 115
  • [39] Optimal testing of VLSI analog circuits
    Chao, CY
    Lin, HJ
    Milor, L
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1997, 16 (01) : 58 - 77
  • [40] A Simple Testing Structure for Analog Circuits
    Ting, Hsin-Wen
    THIRD INTERNATIONAL CONFERENCE ON INFORMATION SECURITY AND INTELLIGENT CONTROL (ISIC 2012), 2012, : 25 - 28
12345