On-line BIST for testing analog circuits

被引：0
|
作者：
Velasco-Medina, J. [1 ]
Rayane, I. [1 ]
Nicolaidis, M. [1 ]
机构：
[1] TIMA/INPG, Grenoble, France
来源：
Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors | 1999年
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页码：330 / 332
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