A topological approach to fault diagnosis in analogue circuits

被引：0
|
作者：
Gao, X.C. [1 ]
Leach, D.P. [1 ]
Chan, S.P. [1 ]
机构：
[1] Engineering School, University of Santa Clara, Santa Clara, CA 95053, United States
来源：
| 1600年 / 60期
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摘要：
ELECTRIC NETWORKS
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