Absorption loss at nanorough silver back reflector of thin-film silicon solar cells

被引：0

作者：

机构：

[1] Springer, J.

[2] Poruba, A.

[3] Müllerova, L.

[4] Vanecek, M.

[5] Kluth, O.

[6] Rech, B.

来源：

Springer, J. (springer@fzu.cz) | 1600年 / American Institute of Physics Inc.卷 / 95期

关键词：

Atomic force microscopy - Chlorine compounds - Light absorption - Morphology - Plasmas - Silicon solar cells - Silver - Spectrometers - Surface plasmon resonance - Surface roughness;

D O I：

暂无

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学科分类号：

摘要：

The spectra of the total absorption loss of nanorough silver surfaces measured with high accuracy is presented. Instead of the measurement of the total reflectance R and calculation of A=(1-R), the A is measured directly using photothermal deflection spectroscopy (PDS). This helps to increase the precision of measurement for the most important case of weak absorption losses.

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