High-resolution reflection electron microscopy of Si(111)7×7 surfaces using a high-voltage electron microscope

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[1] Koike, Hideki

[2] Kobayashi, Kunio

[3] Ozawa, Soh-ichiro

[4] Yagi, Katsumichi

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Koike, Hideki | 1600年 / 28期

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[31] POTENTIAL FOR HIGH-RESOLUTION ELECTRON CRYSTALLOGRAPHY AT INTERMEDIATE HIGH-VOLTAGE
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