TEST GENERATION USING EQUIVALENT NORMAL FORMS.

被引：0
|
作者：
Hayes, John P.
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来源：
Journal of Design Automation & Fault-Tolerant Computing | 1600年 / 3卷 / 3-4期
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Compendex;
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暂无
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摘要：
LOGIC CIRCUITS
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页码：131 / 154
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