共 50 条
- [43] DEPTH RESOLUTION IN-DEPTH PROFILING OF MARKER LAYERS BY ENERGETIC ION-BOMBARDMENT NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 95 (01): : 91 - 96
- [45] Mechanochemical reduction reaction of titanium oxide by calcium Funtai Oyobi Fummatsu Yakin/Journal of the Japan Society of Powder and Powder Metallurgy, 2001, 48 (11): : 1051 - 1055
- [46] THE REDUCTION OF OXYGEN ON TITANIUM-OXIDE ELECTRODES JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1992, 340 (1-2): : 273 - 286
- [47] Phase identification in thin oxide films by AES depth profiling IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1998, 62 (03): : 517 - 522
- [48] DEPTH PROFILING OF HEAVY-ION-MIXED TIN FILMS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 50 (1-4): : 10 - 18
- [49] ANOMALIES OF SECONDARY ION EMISSION DURING DEPTH PROFILING OF SEMICONDUCTORS DOPOVIDI AKADEMII NAUK UKRAINSKOI RSR SERIYA A-FIZIKO-MATEMATICHNI TA TECHNICHNI NAUKI, 1981, (09): : 55 - 56
- [50] MEASUREMENT OF ION SPUTTERING YIELDS FOR IN-DEPTH PROFILING ANALYSIS TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1991, 77 (12): : 2171 - 2178