Determination of parameters of surface mass transport from morphological changes of beaded thin films

被引:0
|
作者
L. Kossuth Univ, Debrecen, Hungary [1 ]
机构
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Role of surface morphological parameters on wettability of obliquely deposited Cu thin films in a plasma focus device
    Foadi, Farnaz
    Etminan, Mahsa
    Aghamir, Farzin M.
    Mohammadizadeh, Mohammad R.
    JOURNAL OF MATERIALS RESEARCH, 2023, 38 (15) : 3666 - 3676
  • [22] Characterization of thin films by surface mass spectrometry
    Gnaser, H
    FOURTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS, 2000, 4086 : 7 - 18
  • [23] Poling Induced Mass Transport in Thin Polymer Films
    Nitiss, Edgars
    Titavs, Eduards
    Kundzins, Karlis
    Dementjev, Andrej
    Gulbinas, Vidmantas
    Rutkis, Martins
    JOURNAL OF PHYSICAL CHEMISTRY B, 2013, 117 (09): : 2812 - 2819
  • [25] KINETICS OF PHASE AND MORPHOLOGICAL-CHANGES IN THIN-FILMS
    TOCHITSKY, EI
    CHEKAN, NM
    JOURNAL OF CRYSTAL GROWTH, 1987, 83 (01) : 115 - 121
  • [26] Morphological Changes of Isotactic Polypropylene Crystals Grown in Thin Films
    Zhang, Bin
    Chen, Jiajia
    Liu, Baochen
    Wang, Binghua
    Shen, Changyu
    Reiter, Renate
    Chen, Jingbo
    Reiter, Guenter
    MACROMOLECULES, 2017, 50 (16) : 6210 - 6217
  • [27] Determination of Optical Parameters in Thin Films by Transmittance Spectra
    Wang Keng
    Jia Hong-zhi
    Xia Gui-zhen
    SPECTROSCOPY AND SPECTRAL ANALYSIS, 2008, 28 (11) : 2713 - 2716
  • [28] Determination of optical parameters of very thin (λ/50) films
    Gushterova, Petya
    Sharlandjiev, Peter
    Hristov, Boian
    APPLIED OPTICS, 2008, 47 (28) : 5117 - 5122
  • [29] Determination of the transport parameters in two-dimensional semiconductor systems and thin films by contactless microware methods
    Kornilovich, AA
    SIBERIAN RUSSIAN WORKSHOPS AND TUTORIALS ON ELECTRON DEVICES AND MATERIALS, EDM 2002, VOL 1, PROCEEDINGS, 2002, : 75 - 76
  • [30] SURFACE TRANSPORT PROPERTIES OF INSB THIN-FILMS
    ZEMEL, A
    SITES, JR
    WIEDER, HH
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (03): : 391 - 391