BETTER MICROPROCESSOR BOARD TESTING.

被引：0

作者：

Brown, Tony

机构：

来源：

New Electronics | 1981年 / 14卷 / 22期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：78 / 80

共 50 条

[1] ECONOMICS OF BARE BOARD TESTING.
Saylor, Roger S.
Electronic Packaging and Production, 1979, 19 (09):
[2] CLIMATIC TESTING.
Bach, Hans Werner
Telcom Report (English Edition), 1980, 3 (04): : 214 - 218
[3] HELICOPTER TRANSMISSION TESTING.
Mangione, Pasquale J.
AGARD Conference Proceedings, 1980, : 1 - 34
[4] SEISMIC RELAY TESTING.
Calhoun, H.J.
American Society of Mechanical Engineers (Paper), 1979,
[5] REPORT ON RANDOM TESTING.
Duran, Joe W.
Ntafos, Simeon
Proceedings - International Conference on Software Engineering, 1981, : 179 - 183
[6] NUCLEAR AND RADIOISOTOPIC TESTING.
Grusin, P.L.
Bochenin, V.I.
Industrial Laboratory (USSR) (English translation of Zavodskaya Laboratoriya), 1975, 41 (11): : 1695 - 1701
[7] FUNCTIONAL PROGRAM TESTING.
Howden, William E.
1978, : 321 - 325
[8] ECONOMICS OF IN-CIRCUIT TESTING.
Smith, Tony
New Electronics, 1979, 12 (23): : 55 - 56
[9] GUIDANCE MANUAL FOR MODEL TESTING.
Anon
American National Standards Institute, Standards, 1980,
[10] GENERAL OVERVIEW OF PROCESSABILITY TESTING.
Johnson, Peter S.
Kautschuk und Gummi, Kunststoffe, 1980, 33 (09): : 725 - 731