X-ray diffraction study of amorphous Ge0.13As0.17Te0.70

被引：0
|
作者：
Ohkawa, Yoshinori [1 ]
Kahata, Hisataka [1 ]
Nakazato, Masahiro [1 ]
Wakabayashi, Nobuyoshi [1 ]
机构：
[1] Keio Univ, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1989年 / 28卷 / 06期
关键词：
11;
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摘要：
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页码：1137 / 1138
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