X-ray diffraction study of amorphous Ge0.13As0.17Te0.70

被引：0
|
作者：
Ohkawa, Yoshinori [1 ]
Kahata, Hisataka [1 ]
Nakazato, Masahiro [1 ]
Wakabayashi, Nobuyoshi [1 ]
机构：
[1] Keio Univ, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1989年 / 28卷 / 06期
关键词：
11;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1137 / 1138
相关论文
共 50 条
  • [1] AN X-RAY-DIFFRACTION STUDY OF AMORPHOUS GE0.13AS0.17TE0.70
    OHKAWA, Y
    KAHATA, H
    NAKAZATO, M
    WAKABAYASHI, N
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (06): : 1137 - 1138
  • [2] Amorphous Ge15Te85: density functional, high-energy x-ray and neutron diffraction study
    Kalikka, J.
    Akola, J.
    Jones, R. O.
    Kohara, S.
    Usuki, T.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2012, 24 (01)
  • [3] X-Ray Diffraction Study of Amorphous Ge(Se1-xTex)2 Alloys
    Uemura, O.
    Hayasaka, N.
    Kameda, Y.
    Usuki, T.
    Physica Status Solidi (B): Basic Research, 200 (02):
  • [4] X-ray diffraction study of amorphous Ge(Se1-xTex)(2) alloys
    Uemura, O
    Hayasaka, N
    Kameda, Y
    Usuki, T
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1997, 200 (02): : 385 - 393
  • [5] Structure of crystalline and amorphous Ge probed by X-ray absorption and diffraction techniques
    Di Cicco, A
    Principi, E
    Minicucci, M
    De Panfilis, S
    Filipponi, A
    Decremps, F
    Datchi, F
    Itié, JP
    Munsch, P
    Polian, A
    HIGH PRESSURE RESEARCH, 2004, 24 (01) : 93 - 99
  • [6] Luminescence and X-ray diffraction studies of Ge nanocrystals in amorphous silicon oxide
    Ng, V
    Ng, SP
    Thio, HH
    Choi, WK
    Wee, ATS
    Jie, YX
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2000, 286 (01): : 161 - 164
  • [7] X-ray diffraction study of Ge-Bi-Te mixed-layer ternary compounds
    Karpinskii, OG
    Shelimova, LE
    Kretova, MA
    Zemskov, VS
    INORGANIC MATERIALS, 2000, 36 (11) : 1108 - 1113
  • [8] Study on the structure of Ge-As-Te glass by X-ray diffraction and reverse Monte Carlo simulation
    Zhang, JM
    Du, JC
    Zhao, XJ
    Xie, K
    JOURNAL OF INORGANIC MATERIALS, 1999, 14 (03) : 368 - 374
  • [9] X-ray diffraction study of Ge-Bi-Te mixed-layer ternary compounds
    O. G. Karpinskii
    L. E. Shelimova
    M. A. Kretova
    V. S. Zemskov
    Inorganic Materials, 2000, 36 : 1108 - 1113
  • [10] X-ray diffraction and Raman spectroscopy studies of Ga-Ge-Te alloys
    Stronski, A. V.
    Shportko, K. V.
    Kochubei, H. K.
    Popovych, M. V.
    Lotnyk, A. A.
    SEMICONDUCTOR PHYSICS QUANTUM ELECTRONICS & OPTOELECTRONICS, 2024, 27 (04) : 404 - 411
12345