Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants

被引：0

作者：

Synowicki, R.A. ^{[1
]}

机构：

[1] J.A. Woollam Co, Inc, Lincoln, United States

来源：

Thin Solid Films | 1998年 / 313-314卷 / 1-2期

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摘要：

引用

页码：394 / 397

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