Antiferromagnetic thickness dependence of blocking temperature in exchange coupled polycrystalline ferromagnet/antiferromagnet bilayers

被引:0
作者
机构
[1] Xi, Haiwen
[2] White, Robert M.
[3] Gao, Zheng
[4] Mao, Sining
来源
Xi, H. | 1600年 / American Institute of Physics Inc.卷 / 92期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
26
引用
收藏
相关论文
共 50 条
[41]   Thickness and Temperature Dependence of Exchange Bias in Co/CoO Bilayers [J].
Demirci, E. ;
Ozturk, M. ;
Topkaya, R. ;
Kazan, S. ;
Akdogan, N. ;
Obaida, M. ;
Westerholt, K. .
JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM, 2012, 25 (08) :2591-2595
[42]   On the exchange bias in single and polycrystalline ferro/antiferromagnetic bilayers [J].
Li, ZJ ;
Zhang, SF .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (11) :7272-7274
[43]   Blocking temperature in exchange coupled MnPt/CoFe bilayers and synthetic antiferromagnets [J].
Rickart, M ;
Guedes, A ;
Ventura, J ;
Sousa, JB ;
Freitas, PP .
JOURNAL OF APPLIED PHYSICS, 2005, 97 (10)
[44]   Controllable magnetic anisotropy of ferromagnet/antiferromagnet bilayers coupled with piezoelectric strain [J].
Kim, Hyun-Joong ;
Jung, Min-Seung ;
You, Chun-Yeol ;
Hong, Jung-Il .
ACTA MATERIALIA, 2019, 171 :170-175
[45]   Temperature dependence of the training effect in exchange coupled ferromagnetic bilayers [J].
Polisetty, S. ;
Sahoo, S. ;
Berger, A. ;
Binek, Ch. .
PHYSICAL REVIEW B, 2008, 78 (18)
[46]   The influence of the cooling field on the exchange bias in ferromagnet/antiferromagnet bilayers system [J].
Tian Hong-Yu ;
Xu Xiao-Yong ;
Hu Jing-Guo .
ACTA PHYSICA SINICA, 2009, 58 (04) :2757-2761
[47]   Antiferromagnetic thickness dependence of exchange biasing [J].
Xi, HW ;
White, RM .
PHYSICAL REVIEW B, 2000, 61 (01) :80-83
[48]   Temperature dependence of exchange field and coercivity in polycrystalline NiO/NiFe film with thin antiferromagnetic layer: Role of antiferromagnet grain size distribution [J].
Khapikov, AF ;
Harrell, JW ;
Fujiwara, H ;
Hou, C .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) :4954-4956
[50]   Theory of the blocking temperature in polycrystalline exchange biased bilayers based on a thermal fluctuation model [J].
Xi, HW ;
White, RM .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (09) :5850-5853