DESIGN FOR FAULT ISOLATION.

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Jhu, Jai Hun
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Electronic Design | 1975年 / 23卷 / 23期
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There are available a number of rather simple-to-implement techniques that can significantly reduce the cost and complexity of fault isolation. These techniques permit the subsequent fault-isolation test system to observe and control specific elements within a circuit so that meaningful tests can be made. The designer may, for example, increase the size of an edgeboard connector to accommodate test points for factory-level tests. In general, fault-isolation testing consists of the creation of a particular set of conditions or sequence of conditions that permit the designer to observe whether the circuit performs as intended. The fault-isolator must have a way to control specific elements within the circuit to apply meaningful tests to individual devices or groups of components.
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页码:86 / 90
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