A Reflection Interference Method for Determining Optical Constants and Thickness of a Thin Solid Film

被引：0

作者：

Yang, Peng ^{[1
]}

Xu, Zhiling ^{[1
]}

Xu, Lei ^{[1
]}

机构：

[1] Department of Physics, Fudan University, State Key Lab. Mat. Modification L., 200433 Shanghai, China

来源：

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis | 2000年 / 20卷 / 03期

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学科分类号：

摘要：

引用

页码：282 / 285

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