A Reflection Interference Method for Determining Optical Constants and Thickness of a Thin Solid Film

被引：0
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作者：
Yang, Peng [1 ]
Xu, Zhiling [1 ]
Xu, Lei [1 ]
机构：
[1] Department of Physics, Fudan University, State Key Lab. Mat. Modification L., 200433 Shanghai, China
来源：
Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis | 2000年 / 20卷 / 03期
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摘要：
6
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页码：282 / 285
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