共 50 条
- [41] Silicon loss metrology using synchrotron x-ray reflectance and Bragg diffraction FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007, 2007, 931 : 196 - +
- [42] Solving the phase problem of X-ray diffraction using atomic resolution X-ray holograms ACTA CRYSTALLOGRAPHICA SECTION A, 1997, 53 : 236 - 241
- [44] X-RAY SPHERICAL-WAVE DIFFRACTION IN THE BRAGG CASE FOR BENT SI CRYSTALS PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1987, 99 (02): : 345 - 351
- [45] Working conditions on designing an X-ray phase plate using three-beam dynamical diffraction Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1996, 372 (03): : 543 - 550
- [46] Working conditions on designing an X-ray phase plate using three-beam dynamical diffraction NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1996, 372 (03): : 543 - 550
- [47] Thermal Stability of α Phase of Titanium by Using X-Ray Diffraction Metallurgical and Materials Transactions A, 2010, 41 : 3287 - 3290
- [48] Thermal Stability of α Phase of Titanium by Using X-Ray Diffraction METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2010, 41A (13): : 3287 - 3290
- [50] X-RAY SECTION TOPOGRAPHY IN THE BRAGG CASE PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 59 (01): : 317 - 322