共 16 条
- [1] Tanie H., Terasaki T., Crack propagation model for reproduction of crack paths in micr-solder joints, Transactions of the Japan Society of Mechanical Engineers, Series A, 72, 717, pp. 638-645, (2006)
- [2] Tanie H., Terasaki T., Fracture life evaluation of solder joints in semiconductor structures using crack propagation analysis, Transactions of the Japan Society of Mechanical Engineers, Series A, 73, 727, pp. 372-378, (2007)
- [3] Mukai M., Monda T., Hirohata K., Takahashi H., Kawakami T., Takahashi K., Damage path simulation of solder joints, Transactions of the Japan Society of Mechanical Engineers, Series A, 72, 721, pp. 1364-1369, (2006)
- [4] Mukai M., Monda T., Hirohata K., Takahashi H., Kawakami T., Damage path simulation of solder bumps under mechanical fatigue tests, Transactions of the Japan Society of Mechanical Engineers, Series A, 73, 736, pp. 1341-1343, (2007)
- [5] Takahashi H., Mukai M., Kawakami T., Evaluation of creep-fatigue crack propagation of Sn-37Pb solder, Transactions of the Japan Society of Mechanical Engineers, Series A, 66, 647, pp. 1343-1349, (2000)
- [6] Terasaki K., Kitano M., Miura H., Evaluation of strain-rate-dependent fatigue crack propagation in 60Sn/40Pb solder, Transactions of the Japan Society of Mechanical Engineers, Series A, 66, 648, pp. 1506-1511, (2000)
- [7] Zhao J., Mutoh Y., Miyashita Y., Wang L., Fatigue crack growth behavior of Sn-Pb and sn-based lead-free solders, Engineering Fracture Mechanics, 70, pp. 2187-2197, (2003)
- [8] Nose H., Sakane M., Yamashita M., Shiokawa K., Crack propagation behaviour of four types of lead and lead-free solders in push-pull low cycle fatigue, Transactions of the Japan Society of Mechanical Engineers, Series A, 68, 665, pp. 88-95, (2003)
- [9] Nose H., Sakane M., Yamashita M., Shiokawa K., Crack initiation and propagation behaviour of three types of solders in torsion low cycle fatigue, Transactions of the Japan Society of Mechanical Engineers, Series A, 69, 684, pp. 1222-1229, (2003)
- [10] Standard for Low Cycle Fatigue Tests of Solder, (2000)