Fatigue crack propagation in lead-free solder under mode I and II loading

被引:0
作者
Tanaka, Keisuke [1 ]
Iwata, Yoshifumi [1 ]
Akiniwa, Yoshiaki [1 ]
机构
[1] Department of Mechanical Engineering, Meijo University, Nagoya-shi, Aichi, 468-8502, 1-501 Shiogamaguchi, Tempaku-ku
来源
Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A | 2009年 / 75卷 / 760期
关键词
Crack propagation; Fatigue; J-integral; Lead-free solder; Mode I; Mode II;
D O I
10.1299/kikaia.75.1738
中图分类号
学科分类号
摘要
Crack propagation tests of lead-free solder were conducted using center-cracked plates (CCP) for tension-compression loading (mode I loading) and thin-walled tubular specimens for torsional loading (mode II loading). Both specimens have an initial slit as a crack starter. The path of crack propagation under mode I loading was macroscopically straight, and perpendicular to the maximum principal stress direction. In tubular specimens under mode II loading, at the high strain amplitude, the crack propagate in shear mode along the maximum shear direction. At low strain amplitude, four cracks are formed from the initial silt and propagate showing macroscopically tensile-mode propagation. The crack propagation rate is expressed as a power function of the Jintegral range for both mode I and II loadings. The relation was not much different between mode I and II loadings. Fatigue crack propagation takes place by joining microcracks formed along the maximum shear planes ahead of the crack tip. At high strain ranges of mode II loading, microcracks ahead of the main crack tip were long and abundant, and their connection with the main crack gave rise shear-mode crack propagation.
引用
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页码:1738 / 1745
页数:7
相关论文
共 16 条
  • [1] Tanie H., Terasaki T., Crack propagation model for reproduction of crack paths in micr-solder joints, Transactions of the Japan Society of Mechanical Engineers, Series A, 72, 717, pp. 638-645, (2006)
  • [2] Tanie H., Terasaki T., Fracture life evaluation of solder joints in semiconductor structures using crack propagation analysis, Transactions of the Japan Society of Mechanical Engineers, Series A, 73, 727, pp. 372-378, (2007)
  • [3] Mukai M., Monda T., Hirohata K., Takahashi H., Kawakami T., Takahashi K., Damage path simulation of solder joints, Transactions of the Japan Society of Mechanical Engineers, Series A, 72, 721, pp. 1364-1369, (2006)
  • [4] Mukai M., Monda T., Hirohata K., Takahashi H., Kawakami T., Damage path simulation of solder bumps under mechanical fatigue tests, Transactions of the Japan Society of Mechanical Engineers, Series A, 73, 736, pp. 1341-1343, (2007)
  • [5] Takahashi H., Mukai M., Kawakami T., Evaluation of creep-fatigue crack propagation of Sn-37Pb solder, Transactions of the Japan Society of Mechanical Engineers, Series A, 66, 647, pp. 1343-1349, (2000)
  • [6] Terasaki K., Kitano M., Miura H., Evaluation of strain-rate-dependent fatigue crack propagation in 60Sn/40Pb solder, Transactions of the Japan Society of Mechanical Engineers, Series A, 66, 648, pp. 1506-1511, (2000)
  • [7] Zhao J., Mutoh Y., Miyashita Y., Wang L., Fatigue crack growth behavior of Sn-Pb and sn-based lead-free solders, Engineering Fracture Mechanics, 70, pp. 2187-2197, (2003)
  • [8] Nose H., Sakane M., Yamashita M., Shiokawa K., Crack propagation behaviour of four types of lead and lead-free solders in push-pull low cycle fatigue, Transactions of the Japan Society of Mechanical Engineers, Series A, 68, 665, pp. 88-95, (2003)
  • [9] Nose H., Sakane M., Yamashita M., Shiokawa K., Crack initiation and propagation behaviour of three types of solders in torsion low cycle fatigue, Transactions of the Japan Society of Mechanical Engineers, Series A, 69, 684, pp. 1222-1229, (2003)
  • [10] Standard for Low Cycle Fatigue Tests of Solder, (2000)