Study of the incremental crosstalk stimulation testing model of high-speed interconnects

被引：0

作者：

Research Inst. of Electronic CAD, Xidian Univ., Xi'an 710071, China ^{[1
]}

不详 ^{[2
]}

机构：

来源：

Xi'an Dianzi Keji Daxue Xuebao | 2009年 / 2卷 / 314-321期

关键词：

Testing - Fault detection;

D O I：

暂无

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摘要：

Crosstalk stimulation testing is a very important issue for high-speed interconnects' signal integrity. Formal description of high-speed interconnects' geometry structure is built. The principle of primary and secondary factors, the principle of effective aggression, and the principle of symmetry are presented. Primary and secondary factors of crosstalk are analyzed based on orthogonal design. An incremental crosstalk stimulation test model is studied according to analytical results. This model takes interconnects' geometry characteristics into account. Fault diagnosis is implemented as soon as test patterns are generated and applied, so both the test set and test time are decreased greatly. Finally, simulation experiments are implemented and results show that the compact index of this model is better than those of the multiple transition model and half-transition model. This model is more effective because it spends less time testing more types of crosstalk faults for the non-ideal interconnect system.

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