The influence of liquid-vapor interface inclination on the microlayer profile reconstruction from interferometry fringe patterns in boiling bubbles

被引:0
|
作者
Choi, Jonghwi [1 ]
Kim, Hyungdae [1 ]
机构
[1] Kyung Hee Univ, Dept Nucl Engn, Seoul, South Korea
关键词
Boiling bubble; Laser interferometry; Microlayer; Microlayer interface angle; Optical distortion and limit; Spatial resolution; HEAT-TRANSFER; GROWTH;
D O I
10.1016/j.applthermaleng.2024.124733
中图分类号
O414.1 [热力学];
学科分类号
摘要
The effect of the liquid-vapor interface slope on the reconstruction of microlayer profiles from interferometry fringe patterns in boiling bubbles was theoretically analyzed. The consideration of inclination may result in distortions and limitations in laser interferometry. During fringe pattern reconstruction into a microlayer profile, the thickness and position can become distorted, whereas the imaging process with a camera introduces lens-out and spatial resolution limits. In this study, we reconstructed the complicated optical path by considering the inclined microlayer top interface through theoretical analysis and examined the four effects caused by that interface. The parameters considered were the angle and thickness of the microlayer, as well as the configuration of the optical system, including working distance, pixel length, and lens size. For a known microlayer geometry simulated using computational fluid dynamics, the reconstructed microlayer profiles when considering the influences of the interface inclination or not were compared. Additionally, measurement limits calculated from the theoretical analysis were validated by comparing with the maximum values measured in existing experimental studies.
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页数:15
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