Junction temperature measurement and luminous properties research of high-power LED

被引：0

作者：

Fei, Xiang ^{[1
]}

Qian, Ke-Yuan ^{[1
]}

Luo, Yi ^{[1
,2
]}

机构：

[1] Semiconductor Lighting Laboratory, Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China

[2] State Key Laboratory on Integrated Optoelectronics, Department of Electronics and Engineering, Tsinghua University, Beijing 100084, China

来源：

Guangdianzi Jiguang/Journal of Optoelectronics Laser | 2008年 / 19卷 / 03期

关键词：

Heat resistance - Semiconductor junctions - Temperature measurement - Thermal conductivity;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：289 / 292