Extended X-ray absorption fine structure spectroscopy of selenium-hyperdoped silicon

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[1] [1,Newman, Bonna K.
[2] 1,Ertekin, Elif
[3] Sullivan, Joseph T.
[4] 1,Winkler, Mark T.
[5] Marcus, Matthew A.
[6] Fakra, Sirine C.
[7] Sher, Meng-Ju
[8] Mazur, Eric
[9] Grossman, Jeffrey C.
[10] Buonassisi, Tonio
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| 1600年 / American Institute of Physics Inc.卷 / 114期
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