Semiconductor manufacturing system daily output prediction based on phase space reconstruction

被引:0
|
作者
Wu, Lihui [1 ]
Zhang, Jie [1 ]
机构
[1] Institute of Computer Integrated Manufacturing, Shanghai Jiaotong University
来源
Jixie Gongcheng Xuebao/Journal of Mechanical Engineering | 2009年 / 45卷 / 08期
关键词
Ant algorithm; Daily output prediction; Neural network; Phase space reconstruction;
D O I
10.3901/JME.2009.08.176
中图分类号
学科分类号
摘要
In order to manage and control semiconductor wafer fabrication system (SWFS) more effectively, the daily output prediction data of wafer fabrication are often used in the planning and scheduling of SWFS. Because of nonlinear certainty and stochastic character of the daily output time series, an artificial neural network prediction method based on phase space reconstruction and ant colony optimization is proposed, in which the chaos phase space reconstruction theory is used to reconstruct the daily output time serials, the neural network is used to construct the daily output prediction model, the ant algorithm is used to train the weight and bias values of the neural network prediction model. Through testing with factory production data and comparing with traditional prediction methods, the effectiveness of the the proposed prediction method is proved. ©2009 Journal of Mechanical Engineering.
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页码:176 / 181
页数:5
相关论文
共 10 条
  • [1] Chen T., An intelligent hybrid system for wafer lot output time prediction, Advanced Engineering Informatics, 27, 1, pp. 55-65, (2007)
  • [2] Shimada Y., Sakurai K., A new accurate yield prediction method for system-LSI embedded memories, IEEE Transactions on Semiconductor Manufacturing, 16, 3, pp. 436-445, (2003)
  • [3] Tian Z., Dynamic Data Processing Theory and Method-Time Series Analysis, (2001)
  • [4] Yang Y.W., Liu G.Z., Multivariate time series prediction based on neural networks applied to stock market, Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, pp. 2680-2683, (2001)
  • [5] Prasad K.D.V., Yarlagadda, Prediction of die casting process parameters by using an artificial neural network model for zinc alloys, International Journal of Production Research, 38, pp. 119-139, (2000)
  • [6] Huang C.L., Huang Y.H., Chang T.Y., Et al., The construction of production performance prediction system for semiconductor manufacturing with artificial neural networks, International Journal of Production Research, 37, 6, pp. 1387-1402, (1999)
  • [7] Lv J., Lu J., Chen S., Chaos Time Series Analysis and Application, (2002)
  • [8] Zhang S.B., Liu Z.M., Neural network training using ant algorithm in ATM traffic control, Proceedings of IEEE International Symposium on Circuits and Systems, pp. 157-160, (2001)
  • [9] Li J.B., Chung Y.K., A novel back propagation neural network training algorithm designed by ant colony optimization, Proceedings of the IEEE Power Engineering Society Transmission and Distribution Conference, pp. 1-5, (2005)
  • [10] Fu H., Liu C., Ma X., Heteroscedastic model of regression and auto-regression, Journal of Mechanical Strength, 26, 4, pp. 355-361, (2004)