Apparent thickness dependence of mobility in organic thin films analyzed by Gaussian disorder model

被引：0

作者：

Chu, Ta-Ya ^{[1
]}

Song, Ok-Keun ^{[1
]}

机构：

[1] Research and Development Center, Samsung SDI, Gongse-dong, Giheung-gu, Yongin, Gyeonggi-do 449-577, Korea, Republic of

来源：

Journal of Applied Physics | 2008年 / 104卷 / 02期

关键词：

Thin films;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Journal article (JA)

引用

共 50 条

[41] Thickness dependence of the martensitic transformation in textured Cu-Al-Ni thin films grown by sputtering on Si (001) [J].

Moran, M. ;

Condo, A. M. ;

Soldera, F. ;

Sirena, M. ;

Haberkorn, N. .

MATERIALS TODAY-PROCEEDINGS, 2019, 14 :96-99

[42] Investigation of thickness dependence of electric properties of sol-gel BNT-BT thin films with stepwise crystallization [J].

Cui Wenhan ;

Wang Xiaohui ;

Wu Yunyi ;

Luo Yun-Gang ;

Li Longtu .

JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 2016, 124 (04) :464-468

[43] Strong thickness dependence of aurivillius phase formation in SrBi2Ta2O9 thin films [J].

Yun-Mo Sung ;

Woo-Chul Kwak ;

Se-Yeon Jung ;

Jung-Joon Na ;

Sang M. Park .

Journal of Electroceramics, 2006, 17 :119-123

[44] Thickness-dependence of magnetic anisotropy and domain structure in Ni thin films grown on a PMN-PT substrate [J].

Xiang, Yuanzhi ;

Liang, Kun ;

Keller, Scott ;

Guevara, Michael ;

Sheng, Michael ;

Yan, Zhuo ;

Zhou, Peng ;

Qi, Yajun ;

Ma, Zhijun ;

Liu, Ying ;

Srinivasan, Gopalan ;

Carman, Gregory P. ;

Zhang, Tianjin ;

Lynch, Christopher S. .

SMART MATERIALS AND STRUCTURES, 2020, 29 (09)

[45] Measurement of electron/hole mobility in organic/polymeric thin films using modified time-of-flight apparatus [J].

Chen, BJ ;

Liu, SY .

SYNTHETIC METALS, 1997, 91 (1-3) :169-171

[46] Thickness dependence of the magnetic properties of high-coercive Pr-Fe-B thin films with perpendicular magnetic anisotropy [J].

Yang, F. ;

Liu, W. ;

Cui, W. B. ;

Feng, J. N. ;

Zhang, Y. Q. ;

Zhang, Z. D. .

PHYSICA B-CONDENSED MATTER, 2008, 403 (19-20) :3631-3634

[47] Thickness dependence of the superconducting properties of γ-Mo2N thin films on Si (001) grown by DC sputtering at room temperature [J].

Haberkorn, N. ;

Bengio, S. ;

Troiani, H. ;

Suarez, S. ;

Perez, P. D. ;

Granell, P. ;

Golmar, F. ;

Sirena, M. ;

Guimpel, J. .

MATERIALS CHEMISTRY AND PHYSICS, 2018, 204 :48-57

[48] Thickness dependence of strain and in-plane dielectric properties of highly (001) oriented (Ba,Sr)TiO3 thin films [J].

Lu, Shengbo ;

Xu, Zhenkui ;

Zhai, Jiwei .

THIN SOLID FILMS, 2010, 518 (21) :5928-5931

[49] Investigation of thickness dependence on electronic structures of iron and nickel thin films by L-edge X-ray absorption spectroscopy [J].

Akgul, Guvenc ;

Akgul, Funda Aksoy ;

Ufuktepe, Yuksel .

VACUUM, 2014, 99 :211-215

[50] Dependence of Epitaxial Ba(Fe1-xCox)2As2 Thin Films Properties on SrTiO3 Template Thickness [J].

Lee, S. ;

Jiang, J. ;

Weiss, J. D. ;

Bark, C. W. ;

Tarantini, C. ;

Biegalski, M. D. ;

Polyanskii, A. ;

Zhang, Y. ;

Nelson, C. T. ;

Pan, X. Q. ;

Hellstrom, E. E. ;

Larbalestier, D. C. ;

Eom, C. B. .

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2011, 21 (03) :2882-2886

← 1 2 3 4 5 →