Faults diagnosis approach for analog circuit based on complex cross-wavelet transform

被引：0
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作者：
机构：
[1] Ma, Lan
[2] Wang, Hou-Jun
来源：
Ma, L. | 2013年 / Univ. of Electronic Science and Technology of China卷 / 42期
关键词：
13;
D O I：
10.3969/j.issn.1001-0548.2013.03.012
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