Comment on theoretical analysis of numerical aperture increasing lens microscopy [ J. Appl. Phys.97, 053105 (2005)]

被引：0

作者：

Sheppard, Colin J.R. ^{[1
,2
]}

Huat, Goh Szu ^{[3
]}

机构：

[1] Division of Bioengineering, National University of Singapore, 9 Engineering Drive 1, Singapore 117576, Singapore

[2] Department of Diagnostic Radiology, National University of Singapore, 5 Lower Kent Ridge Road, Singapore 119074, Singapore

[3] Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR), Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576, Singapore

来源：

Journal of Applied Physics | 2006年 / 100卷 / 08期

关键词：

In a recent paper; Ippolito; J; Appl; Phys; 97; 053105 (2005)] analyzed focusing at high numerical aperture into a dielectric medium. They considered three geometries; those of focusing through a level planar interface and through spherical interfaces arranged in concentric or aplanatic positions. The treatment for focusing through a planar interface is based on a different model from that presented elsewhere. It is shown that this model describes the aberration effect only approximately; in contrast to the previous; rigorous treatment. © 2006 American Institute of Physics;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Journal article (JA)

引用