Quantitative analyses on claim structures of patent applications filed by market leaders in the fields of analyzing and diagnostic devices

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作者：

Intellectual Property Division, Seiko Epson Corporation, Nagano-ken, Japan ^{[1
]}

不详 ^{[2
]}

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来源：

IEEM - IEEE Int. Conf. Ind. Eng. Eng. Manage. | 1600年 / 64-68期

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D O I：

IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2009

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摘要：

Diagnosis - Patents and inventions - Commerce

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