X-ray dark-field and phase-contrast imaging using a grating interferometer

被引：0

作者：

Pfeiffer, F. ^{[1
]}

Bech, M. ^{[2
]}

Bunk, O. ^{[3
]}

Donath, T. ^{[3
]}

Henrich, B. ^{[3
]}

Kraft, P. ^{[3
]}

David, C. ^{[3
]}

机构：

[1] Department of Physics, Technische Universität München, 85748 Garching, Germany

[2] Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen, Denmark

[3] Paul Scherrer Institut, 5232 Villigen PSI, Switzerland

来源：

Journal of Applied Physics | 2009年 / 105卷 / 10期

关键词：

In this letter; we report results obtained with a recently developed approach for grating-based x-ray dark-field imaging [F. Pfeiffer; Nat; Mater; 7; 134 (2008)]. Since the image contrast is formed through the mechanism of small-angle scattering; it provides complementary and otherwise inaccessible structural information about the specimen at the micron and submicron length scales. Our approach is fully compatible with conventional transmission radiography and the grating-based hard x-ray phase-contrast imaging scheme [F. Pfeiffer; Phys; 2; 258 (2006)]. Since it can be used with standard x-ray tube sources; we envisage widespread applications to x-ray medical imaging; industrial nondestructive testing; or security screening. © 2009 American Institute of Physics;

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Journal article (JA)

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