We present a simple analytical model that describes ion transport in a planar junction between an electrolyte and a conducting polymer film. When ions are injected in the film;
holes recede;
leading to partial dedoping of the film. This is modeled by two resistors in series;
an ionic one for the dedoped part and an electronic one for the still-doped part. We show that analytical predictions can be made for the temporal evolution of the drift length of ions and the current;
variables that could be assessed experimentally. A numerical model based on forward time iteration of drift/diffusion equations is used to validate these predictions. Using realistic materials parameters;
we find that the analytical model can be used to obtain the ion drift mobility in the film;
and as such;
it might be useful towards the development of structure vs. ion transport properties relationships in this important class of electronic materials. © 2013 AIP Publishing LLC;