Fabrication of a TEM sample of ion-irradiated material using focused ion beam microprocessing and low-energy Ar ion milling

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Nuclear Materials Research Division, Korea Atomic Energy Research Institute, 1045 Daedeok-daero, Yuseong-Gu, Daejeon [1 ]
305-353, Korea, Republic of
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Microsc. | / 6卷 / 463-468期
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Compilation and indexing terms; Copyright 2025 Elsevier Inc;
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摘要：
Argon - Fabrication - Focused ion beams - Gallium - Milling (machining) - Surface defects
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