Characterization of microstructures and optoelectrical properties of microcrystalline silicon thin films

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作者：
机构：
[1] Zhang, Linrui
[2] Zhou, Bingqing
[3] Zhang, Lili
[4] Li, Haiquan
来源：
Zhou, B. (zhoubq@imnu.edu.cn) | 1600年 / Science Press卷 / 34期
关键词：
Microstructure;
D O I：
10.3969/j.issn.1672-7126.2014.02.12
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