Calibration of the pressure sensitivity of microphones by a free-field method at frequencies up to 80 kHz
被引:0
作者:
Zuckerwar, Allan J.
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机构:
NASA Langley Research Center, Hampton, VA 23681, United States
Analytical Services and Materials, Inc., Hampton, VA 23666, United StatesNASA Langley Research Center, Hampton, VA 23681, United States
Zuckerwar, Allan J.
[1
,3
]
Herring, G.C.
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h-index: 0
机构:
NASA Langley Research Center, Hampton, VA 23681, United StatesNASA Langley Research Center, Hampton, VA 23681, United States
Herring, G.C.
[1
]
Elbing, Brian R.
论文数: 0引用数: 0
h-index: 0
机构:
University of Michigan, Ann Arbor, MI 48109, United StatesNASA Langley Research Center, Hampton, VA 23681, United States
Elbing, Brian R.
[2
]
机构:
[1] NASA Langley Research Center, Hampton, VA 23681, United States
[2] University of Michigan, Ann Arbor, MI 48109, United States
[3] Analytical Services and Materials, Inc., Hampton, VA 23666, United States
来源:
Journal of the Acoustical Society of America
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2006年
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119卷
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01期