Automatic particle detection and counting by one-class SVM from microscope image

被引：0

作者：

Kuba, Hinata ^{[1
]}

Hotta, Kazuhiro ^{[1
]}

Takahashi, Haruhisa ^{[1
]}

机构：

[1] University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo 182-8585, Japan

来源：

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) | 2009年 / 5507 LNCS卷 / PART 2期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Support vector machines

引用

页码：361 / 368

共 2 条

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[2] A novel detection technique based on benign samples and one-class algorithm for malicious PDF documents containing JavaScript
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