An experimental study of contact effects in organic thin film transistors

被引：0
|
作者：
Gundlach, D.J. [1 ,3 ]
Zhou, L. [1 ]
Nichols, J.A. [1 ,4 ]
Jackson, T.N. [1 ]
Necliudov, P.V. [2 ,5 ]
Shur, M.S. [2 ]
机构：
[1] Department of Electrical Engineering, Pennsylvania State University, 121 Electrical Engineering East, University Park, PA 16802
[2] Department of Electrical Engineering, C11, Rensselaer Polytechnic Institute, 110 8th Street, Troy, NY 12180
[3] National Institute of Standards and Technology, Gaithers-burg, MD 20899
[4] 3M, St. Paul, MN 55114
[5] Intel, Hudson, MA
来源：
Journal of Applied Physics | 2006年 / 100卷 / 02期
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