Investigation of contact-force dependent effects in conductive atomic force microscopy on Si and GaAs

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作者：
Brezna, W. [1 ]
Smoliner, J. [1 ]
机构：
[1] Institut für Festkörperelektronik, TU-Wien, Floragasse 7, A-1040 Wien, Austria
来源：
Journal of Applied Physics | 2008年 / 104卷 / 04期
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