共 21 条
- [1] Zhang D., Xu Z., Li B., Study on optical property of DLC/Ag/DL C multilayer films, Acta Optica Sinica, 28, 10, pp. 2031-2035, (2008)
- [2] Hishikawa Y., Nakamura N., Tsuda S., Et al., Interference-free determination of the optical-absorption coefficient and the optical gap of amorphous-silicon thin-films, Jpn. J. Appl. Phys., 30, 5, pp. 1008-1014, (1991)
- [3] Tang J., Gu P., Li X., Et al., Modern Optical Thin Film Technology, (2006)
- [4] Han J., Tan M., Zhu J., Et al., Properties of tetrahedral amorphous carbon films characterized by X-Ray reflectivity technique, Acta Optica Sinica, 25, 4, pp. 572-576, (2005)
- [5] Zhong D., Wang L., Yu Y., Optical constants measurement of thin film by spectrophotometry, J. Liaoning University(Natural Sciences Edition), 23, 2, pp. 1-13, (1996)
- [6] Xue C., Yi K., Wei C., Et al., Optical constants of DUV/UV fluoride thin films, Chin. Opt. Lett., 7, 5, pp. 449-451, (2009)
- [7] Chen Y., Yu F., Test methods for film thickness and optical constants, Optical Instruments, 28, 6, pp. 84-88, (2006)
- [8] Yang K., Wang X., Bu Y., Research progress of ellipsometer, Laser & Optoelectronics Progress, 44, 3, pp. 43-49, (2007)
- [9] Palik E.D., Handbook of Optical Constants of Solids, pp. 89-110, (1985)
- [10] Hilfiker J.N., Bungay C.L., Synowicki R.A., Et al., Progress in spectroscopic ellipsometry: applications from vacuum ultraviolet to infrared, J. Vac. Sci. Technol. A, 21, 4, pp. 1103-1108, (2003)