Application of histogram on micro-scanning position calibration of microscopic thermal imaging

被引：0

作者：

Guan, Congrong ^{[1
]}

Jin, Weiqi ^{[2
]}

Wang, Jihui ^{[2
]}

机构：

[1] College of Mechanical Electronical and Engineering, North China University of Technology, Beijing 100041, China

[2] Key Laboratory of Photoelectric Imaging Technology and System, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China

来源：

Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering | 2013年 / 42卷 / 02期

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摘要：

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页码：519 / 523