Application of histogram on micro-scanning position calibration of microscopic thermal imaging

被引:0
作者
Guan, Congrong [1 ]
Jin, Weiqi [2 ]
Wang, Jihui [2 ]
机构
[1] College of Mechanical Electronical and Engineering, North China University of Technology, Beijing 100041, China
[2] Key Laboratory of Photoelectric Imaging Technology and System, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China
来源
Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering | 2013年 / 42卷 / 02期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:519 / 523
相关论文
empty
未找到相关数据