Statistical analysis of scanning tunneling microscopy images of 'striped' mixed monolayer protected gold nanoparticles

被引：0
|
作者：
Hu, Ying [1 ]
Wunsch, Benjamin H. [1 ]
Sahni, Sahil [1 ]
Stellacci, Francesco [1 ]
机构：
[1] Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, 13-4053 Cambridge, MA 02139-4307, United States
来源：
Journal of Scanning Probe Microscopy | 2009年 / 4卷 / 01期
关键词：
D O I：
10.1166/jspm.2009.1004
中图分类号：
学科分类号：
摘要：
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页码：24 / 35
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