Characterization of As2S3 thin surface films using sem and afm methods

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[1] Moldovan, A.
[2] EnǍchescu, M.
[3] Popescu, A.A.
[4] MihǍilescu, M.
[5] Neguţu, C.
[6] Baschir, L.
[7] Vasile, G.C.
[8] Savastru, D.
[9] Iovu, M.S.
[10] Verlan, V.I.
[11] Bordian, O.T.
[12] Vasile, I.M.
[13] Puşcaş, N.N.
来源：
EnǍchescu, M. (marius.enachescu@upb.ro) | 1600年 / Politechnica University of Bucharest卷 / 76期
关键词：
Chalcogenides - Amorphous films - Atomic force microscopy - Pulsed laser deposition - Plasmonics - Glass substrates - Thin films - Surface topography - Light scattering;
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