Analysis of IGBT open-circuit fault characteristic in VSC-HVDC

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[1] [1,Sun, Xiaoyun
[2] Tong, Xiangqian
[3] Gao, Xin
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Sun, Xiaoyun | 1600年 / Science Press卷 / 40期
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16;
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10.13336/j.1003-6520.hve.2014.08.039
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