Ultrafast pump-probe detection of X-ray induced transient optical reflectivity changes in GaAs

被引：0

作者：

Wang, Bo ^{[1
,2
,3
]}

Bai, Yonglin ^{[1
,2
]}

Xu, Peng ^{[2
]}

Gou, Yongsheng ^{[2
,3
]}

Zhu, Bingli ^{[2
]}

Bai, Xiaohong ^{[1
]}

Liu, Baiyu ^{[2
]}

Qin, Junjun ^{[1
]}

机构：

[1] State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an,710119, China

[2] Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an,710119, China

[3] University of Chinese Academy of Sciences, Beijing,100049, China

来源：

Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering | 2015年 / 44卷 / 10期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

X ray detectors

引用

页码：3130 / 3133

共 2 条

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