Effect of solder volume on shear strength of Sn-3.0Ag-0.5Cu solder and Cu metallization

被引:0
作者
School of Materials and Engineering, Harbin Institute of Technology, Harbin 150001, China [1 ]
不详 [2 ]
机构
[1] School of Materials and Engineering, Harbin Institute of Technology
[2] Samsung Semiconductor (China) R and D CO. LTD., Suzhou 215021
来源
J. Shanghai Jiaotong Univ. Sci. | 2008年 / SUPPL.卷 / 149-152期
关键词
Shear strength; Solder volume;
D O I
10.1007/s12204-008-0949-z
中图分类号
学科分类号
摘要
Shear behavior of Sn-3.0Ag-0.5Cu solder joints on ball grid array substrates was investigated with different solder volumes and shear speeds to study the solder volume effect on shear properties. Both solder volume and shear speed were found to have strong effect on the shear strength. The shear force decreases obviously with the decrease of the solder volume due to the significant decrease of loaded area, while the shear strength increases sharply with the decrease of solder volume as a result of the discrepancy of interfacial reaction and microstructure. And the shear strength increases rapidly with the increase in shear speed due to the limited grain boundaries or interphase boundaries sliding and dislocation movement and the shear speed has stronger effect on the small solder joints. After the shear test, fracture surfaces were investigated by canning electron microscopy equipped with energy dispersed x ray and it was found that the fracture mode of as-reflowed solder joints was primary ball cut within the bulk solder near the interface with a ductile rupture. The results suggest that even if the solder shear tests showed the same fracture mechanism, solder volume still has great effect on the shear properties at each different shear speed.
引用
收藏
页码:149 / 152
页数:3
相关论文
共 50 条
  • [21] Shear strength and fracture behavior of reflowed Sn3.0Ag0.5Cu/Cu solder joints under various strain rates
    Hu, Xiaowu
    Xu, Tao
    Keer, Leon M.
    Li, Yulong
    Jiang, Xiongxin
    JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 690 : 720 - 729
  • [22] Effect of Cu electroplating parameters on microvoid formation and high-speed shear strength in Sn-3.0Ag-0.5Cu/Cu joints
    Park, Jae-Yong
    Seo, Wonil
    Yoo, Sehoon
    Kim, Young-Ho
    JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 724 : 492 - 500
  • [23] Nanocomposite SAC solders: the effect of adding CoPd nanoparticles on the morphology and the shear strength of the Sn–3.0Ag–0.5Cu/Cu solder joints
    Andriy Yakymovych
    Adam Slabon
    Peter Švec
    Yuriy Plevachuk
    Lubomir Orovcik
    Otto Bajana
    Applied Nanoscience, 2020, 10 : 4603 - 4607
  • [24] Retardation Effect of Tin Multilayer on Sn-3.0Ag-0.5Cu (SAC305)-Based Solder Joint Interface
    Char, Monalisa
    Chakraborty, Amit K.
    Metya, Avijit Kr.
    Kar, Abhijit
    JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE, 2020, 29 (04) : 2305 - 2315
  • [25] Contrastive Study on Shear Strength and Fracture Mechanism of Sn-9Zn-2.5Bi-1.5In and Sn-3.0Ag-0.5Cu Solder Joints with Aging Treatment
    Gong, Shiliang
    Zhang, Gong
    Ren, Anshi
    2022 23RD INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2022,
  • [26] Kinetics of Interfacial Reaction between Sn-3.0Ag-0.5Cu Solder and Co-4.0P or Co-8.0P Metallization
    Yang, Donghua
    Yang, Guoshuai
    Cai, Jian
    Wang, Qian
    Li, Jingwei
    Hu, Yang
    Li, Liangliang
    2015 16TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, 2015,
  • [27] Ni and Sb improve the microstructure, mechanical properties, and solder joint reliability of Sn-3.0Ag-0.5Cu alloy
    Wang, Biao
    Yan, Jikang
    Liu, Jiangshan
    Zhao, Jianhua
    Zhao, Lingyan
    VACUUM, 2025, 231
  • [28] Study on Short Time Interfacial Reactions between Sn-3.0Ag-0.5Cu Solder Balls and ENEPIG Pads
    Yang, Fan
    Huang, Mingliang
    Zhao, Ning
    2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 498 - 501
  • [29] Effect of nano-Al2O3 reinforcement on the microstructure and reliability of Sn-3.0Ag-0.5Cu solder joints
    Zhao, Zhenyu
    Liu, Lei
    Choi, Hyun Seok
    Cai, Jian
    Wang, Qian
    Wang, Yuming
    Zou, Guisheng
    MICROELECTRONICS RELIABILITY, 2016, 60 : 126 - 134
  • [30] Effect of Rapid Thermal Fatigue on Microstructure and Properties of Sn3.0Ag0.5Cu/Cu Solder Bumps
    Tian, Mizhe
    Gan, Guisheng
    Cao, Huadong
    Yang, Donghua
    Jiang, Liujie
    Xia, Daquan
    Sun, Pengfei
    Liu, Xin
    Wu, Yiping
    2020 21ST INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2020,