Diagnosis of X-ray backlighter based on laser plasma

被引：0

作者：

Wang, Hongjian ^{[1
,3
]}

Xiao, Shali ^{[2
]}

Ye, Yan ^{[1
]}

Wang, Hairong ^{[1
,2
]}

Li, Zeren ^{[1
]}

机构：

[1] Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang

[2] Key Laboratory of Opto-Ectronic Technology and System, Ministry of Education, Chongqing University

[3] Chongqing Engineering Technology Research Center for Information Management in Development, Chongqing Technology and Business University

来源：

Zhongguo Jiguang/Chinese Journal of Lasers | 2014年 / 41卷 / 03期

关键词：

Elliptically bent crystal spectrometer; Laser plasma; Plasma spectroscopy; SGII; Spectroscopy; X-ray backlighter;

D O I：

10.3788/CJL201441.0315001

中图分类号：

学科分类号：

摘要：

To study the characteristics of X-ray backlighter generated by laser irradiating a foil, a backlit elliptically bent crystal spectrometer is developed based on the ellipse focusing theory. The elliptical mica (002) crystal is employed with 1350 mm focal length, 0.9586 eccentricity and 50°~67° Bragg angle. The laser is of 30° incident angle and perpendicular to long axis of elliptical mica. Diffraction detecting angle is 100°~120° and the wavelength is 0.14~0.16 nm. X-ray CCD is taken as the signal detector. The experiment is carried out on SGII where the 7# and 8# lasers irradiate 10 μm Cu foil simultaneously. CCD obtains the X-ray spectral information of the similar helium and Kα spectra of Cu plasma X-ray. It is demonstrated by spectrum unfolding that spectral lines have obvious basement, and the spectral resolution is over 700 after difference denoising with the least square method.

引用

共 16 条

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