Diagnosis of X-ray backlighter based on laser plasma

被引:0
作者
Wang, Hongjian [1 ,3 ]
Xiao, Shali [2 ]
Ye, Yan [1 ]
Wang, Hairong [1 ,2 ]
Li, Zeren [1 ]
机构
[1] Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang
[2] Key Laboratory of Opto-Ectronic Technology and System, Ministry of Education, Chongqing University
[3] Chongqing Engineering Technology Research Center for Information Management in Development, Chongqing Technology and Business University
来源
Zhongguo Jiguang/Chinese Journal of Lasers | 2014年 / 41卷 / 03期
关键词
Elliptically bent crystal spectrometer; Laser plasma; Plasma spectroscopy; SGII; Spectroscopy; X-ray backlighter;
D O I
10.3788/CJL201441.0315001
中图分类号
学科分类号
摘要
To study the characteristics of X-ray backlighter generated by laser irradiating a foil, a backlit elliptically bent crystal spectrometer is developed based on the ellipse focusing theory. The elliptical mica (002) crystal is employed with 1350 mm focal length, 0.9586 eccentricity and 50°~67° Bragg angle. The laser is of 30° incident angle and perpendicular to long axis of elliptical mica. Diffraction detecting angle is 100°~120° and the wavelength is 0.14~0.16 nm. X-ray CCD is taken as the signal detector. The experiment is carried out on SGII where the 7# and 8# lasers irradiate 10 μm Cu foil simultaneously. CCD obtains the X-ray spectral information of the similar helium and Kα spectra of Cu plasma X-ray. It is demonstrated by spectrum unfolding that spectral lines have obvious basement, and the spectral resolution is over 700 after difference denoising with the least square method.
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