Low-temperature self-diffusion of iron in the56Fe/ 57Fe stable-isotope thin-film system

被引：0

作者：

Vasylyev, M. ^{[1
]}

Sidorenko, S. ^{[2
]}

Voloshko, S. ^{[2
]}

Kostiuchenko, V. ^{[2
]}

Kotenko, I. ^{[2
]}

机构：

[1] Institute of Metal Physics, Nat. Acad. Sci. Ukraine, 03680 Kiev-142

[2] National Technical University Kiev Polytechnic Institute, 03056 Kiev-56

来源：

Defect and Diffusion Forum | 2007年 / 261-262卷

关键词：

Depth profile; Self-diffusion; SIMS; Stable isotopes; Thin films;

D O I：

10.4028/www.scientific.net/ddf.261-262.85

中图分类号：

学科分类号：

摘要：

Low-temperature diffusion in thin films of the stable isotopes, 56Fe/57Fe, was studied by applying secondary ion mass spectrometry (SIMS), Processing of the concentration profiles obtained was done by using the Hall - Morabitto median gradient" method. The bulk and intergrain self-diffusion coefficients were determined."

引用

页码：85 / 92

页数：7