Alpha-particle-induced upsets in advanced CMOS circuits and technology

被引：20

作者：

Heidel, David F. ^{[1
]}

Rodbell, Kenneth P. ^{[1
]}

Cannon, Ethan H. ^{[2
]}

Cabral, Cyril, Jr. ^{[1
]}

Gordon, Michael S. ^{[1
]}

Oldiges, Phil ^{[3
]}

Tang, Henry H. K. ^{[1
]}

机构：

[1] IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA

[2] IBM Syst & Technol Grp, Essex Jct, VT 05452 USA

[3] IBM Semicond Res & Dev Ctr, Syst & Technol Grp, Hopewell Jct, NY 12533 USA

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 2008年 / 52卷 / 03期

关键词：

D O I：

10.1147/rd.523.0225

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets, the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle-induced upsets are no longer limited to memory circuits. Latch circuits have become highly, sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability.

引用

页码：225 / 232

页数：8

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