Alpha-particle-induced upsets in advanced CMOS circuits and technology

被引：0
|
作者：
Heidel, David F. [1 ]
Rodbell, Kenneth P. [1 ]
Cannon, Ethan H. [2 ]
Cabral Jr., Cyril [1 ]
Gordon, Michael S. [1 ]
Oldiges, Phil [3 ]
Tang, Henry H.K. [1 ]
机构：
[1] IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598, United States
[2] IBM Systems and Technology Group, 1000 River Street, Essex Junction, VT 05452, United States
[3] IBM Semiconductor Research and Development Center, Systems and Technology Group, Hopewell Junction, NY 12533, United States
来源：
IBM Journal of Research and Development | 2008年 / 52卷 / 03期
关键词：
In this paper; we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets; the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle- induced upsets are no longer limited to memory circuits. Latch circuits have become highly sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability. © Copyright 2008 by International Business Machines Corporation;
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页码：225 / 231
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