Analysis of stray light caused by thermal radiation of infrared detection system

被引：0
作者：
Niu J. [1 ,2 ,3 ]
Zhou R. [1 ]
Liu Z. [1 ]
Yang J. [1 ,3 ]
Cai Z. [1 ,3 ]
Lin F. [1 ,3 ]
机构：
[1] Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an
[2] School of Mechanics, North China Institute of Water Conservancy and Hydroelectric Power, Zhengzhou
[3] Graduate University of Chinese Academy of Sciences
来源：
Guangxue Xuebao/Acta Optica Sinica | 2010年 / 30卷 / 08期
关键词：
Infrared detection; Ritchey-Chretien(R-C) system; Stray light; Thermal radiation; TracePro software;
D O I：
10.3788/AOS20103008.2267
中图分类号：
学科分类号：
摘要：
A typical infrared detection system [Ritchey-Chretien (R-C) system] and its baffles are designed. Its structure model is established with the TracePro software. Stray lights caused by thermal radiation of critical inner surface are analyzed by a ray tracing program. The relation of photons of stray lights and temperature which varies from 250 K to 320 K is given. The stray light caused by sky background is calculated. The curve of increasing rate of photon number of stray lights received by single pixel versus temperature is given. The results show that an open telescope without main tube cannot do well obviously in reducing stray lights. The temperature of the inner baffle of main mirror should be less than 230 K in order to detect the background-limited target.
引用
收藏
页码：2267 / 2271
页数：4
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